作者: Arindam Chatterjee , Steven Teig
DOI:
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摘要: The present invention introduces novel methods of performing integrated circuit layout extraction. In the system invention, a complex extraction problem is first broken down into set smaller sub problems. Some problems may be handled by simple parametric models. However, for frequent problems, machine learning used to build Specifically, Support Vector Machines are constructed extract desired electrical characteristics. To Machines, Experimental design employed select training points that provide best information. one embodiment, point created creating critical input spanning set, adding from regions in space, and frequently encountered profile cases. then train Machine will characteristics problem.