作者: Klaus Zimmer , Xi Wang , Pierre Lorenz , Lukas Bayer , Martin Ehrhardt
DOI: 10.1016/J.PHPRO.2014.08.014
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摘要: Abstract The optimization of laser scribing for the interconnection CIGS solar cells is a current focus process development. In addition to geometry scribes impact patterning electrical properties has be optimized with regards and sources. In-process measurements provide an approach reliable evaluation characteristics. particular, parallel resistanceR p that was calculated from measured I–V curves in dependence on parameters short-pulsed ns comparison standard ps at wavelength 1.06 μm. With low pulse overlap ∼20% reduction R 2/3 initial value been achieved pulses. slightly more defects were observed investigated parameter range.