Nanostructure and strain analysis of CeO2/YSZ strained superlattice
作者： Takanori Kiguchi , Toyohiko J. Konno , Naoki Wakiya , Hitoshi Morioka , Keisuke Saito
DOI: 10.1016/J.MSEB.2010.02.013
关键词:
摘要: Abstract In this study, the nanostructure and strain fields in superlattice [CeO 2 /YSZ] 5 fabricated on SiO /Si(0 0 1) substrate were investigated macroscopically nanoscopically using X-ray diffraction (XRD) high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) related methods. The XRD analyses elucidated that out-of-plane lattice parameter of CeO YSZ layers is relaxed. However, in-plane almost identical. Results HRTEM revealed form a structure. show has some defect structure, such as misorientation, varied thickness layers, artificial periodicity, interface roughness. periodicity corresponding to also equal local deviation. Therefore, effect persists degree.
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