Annealing and Recrystallization of Single Crystals of Polyethylene on Graphite: An Atomic Force Microscopy Study

摘要: In situ and ex‐situ atomic force microscopy (AFM) studies of annealing solution‐grown single crystals polyethylene (PE) on graphite were performed at temperatures up to 170°C. Structural changes the began ∼90°C interface between lamellar crystal substrate where solvent traces are likely trapped after collapse. Initially, material edges in a few central locations lozenge‐shaped was converted into 20 nm wide 3 nm thick strands. As temperature increases, this transformation spreads over whole crystal, 110°C arrays strands, which oriented differently different sectors, completely filled lozenge frame. The final morphology, reflects recrystallization most reorientation PE chains from vertical horizontal direction with respect substrate, does not depend sample drying prior experiments. Annealing rec...