Visualization of Polymer Structures with Atomic Force Microscopy

摘要: In last two decades, microscopic characterization of materials has significantly advanced with the inventions scanning tunneling microscopy (STM) and atomic force (AFM) [1, 2]. STM, current between a sharp metallic probe placed in close proximity to conducting surface is used as probing interaction. Tunneling range nanoamperes originates when bias voltage applied this sample. Rastering performed over at separations small enough for stable detection these electrodes. This realized high accuracy using three-dimensional piezoceramic actuator. microscopes, feedback mechanism keeps tip-sample constant every location by adjusting vertical separation. Changes piezoactuator, which are needed adjust separation, presented height image. image, first approximation, reproduces topography Atomic-scale resolution, routinely achieved made it an invaluable addition family techniques. Another remarkable feature such microscopes their ability examine samples not only ultrahigh (DRV) vacuum but also ambient conditions even under liquids. At present, STM become mature technique that widely visualization structures atomic-scale processes on different substrates, especially DRV conditions.