Atomic force microscopy of reovirus dsRNA: a routine technique for length measurements.

作者: Yuri L. Lyubchenko , Bertram L. Jacobs , Stuart M. Lindsay

DOI: 10.1093/NAR/20.15.3983

关键词:

摘要: Atomic force microscopy (AFM) was used to image reovirus double stranded RNA (dsRNA) deposited from diluted buffer solution onto a chemically treated mica surface. This procedure allows AFM images of dsRNA molecules be obtained with quality close that conventional electron microscopy. The length the were measured directly on computer display using digitally acquired images. lengths varied between 0.2 and 1.8 microns. Statistical analysis showed multimodal distribution clear maxima at 0.4, 0.65 1.05 These data are in good agreement those by gel electrophoresis.

参考文章(0)