Use of an ultrasonic resonance technique to measure the in-plane Young's modulus of thin diamond films deposited by a d.c. plasma jet
作者： L Chandra , TW Clyne , None
DOI: 10.1007/BF00819956
关键词:
摘要: In this letter an outline is given of how a simple procedure for the measurement resonant frequency can be applied to substrate, before and after deposition thin adherent film, so as measure Young's modulus film with fair degree accuracy. Some illustrative data are presented metallic coatings produced by electrodeposition diamond deposied using d.c. plasma torch
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