作者: D. Copeland , A. Chan
DOI: 10.1109/ITHERM.2004.1319180
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摘要: As feature dimensions of processors shrink to 100 nanometers and smaller, leakage current becomes a significant part total power dissipation. The magnitude dissipated as can approach half that the active at higher junction temperatures. Leakage exhibits strong exponential relationship with temperature. Reduction temperatures from traditional value 85 C near-ambient 25 reduce fraction its usual value, by nearly one-third. Representative models were chosen for 100, 65 nm technologies, projected years 2003, 2005 2007. Using these models, reduction was calculated range cold plate 15 C. This compared compressor in same range. When static is 30% C, lowest highest 50% constant throughout