作者: X.B. Hu , S.S. Jiang , X.R. Huang , W.J. Liu , C.Z. Ge
DOI: 10.1016/S0022-0248(96)00893-7
关键词:
摘要: The growth defects in flux-grown NdxY1 − xAl3(BO3)4 (NYAB) single crystals have been investigated by means of chemical etching and synchrotron radiation techniques. band-shaped polysynthetic twins were detected optical microscopy due to the difference rates between host crystal twin. In meantime, orientation symmetry analyzed from their patterns. A large number etch pits with regular shapes also found on surface, these correspond outcrops dislocations originating seed or inclusions.