作者: Jing Li , Jiyang Wang , Xiufeng Cheng , Xiaobo Hu , Xinqiang Wang
DOI: 10.1016/J.MATLET.2003.08.026
关键词: Crystal 、 Transmission electron microscopy 、 Crystallography 、 Flux method 、 Powder diffraction 、 Materials science 、 Crystal growth 、 Crystal structure 、 Yttrium 、 Single crystal
摘要: Abstract Single crystal of terbium-doped yttrium aluminum tetraborate Tb:YAl3(BO3)4 (Tb:YAB) has been grown by the flux method. X-ray powder diffraction (XRPD) was used to check lattice structure crystal. The unit-cell parameters calculated TEROR program are a=b=9.3098 A, c=7.2547 A and V=542.53 A3. transmittance fluorescence spectrums Tb3+:YAl3(BO3)4 measured at room temperature. position cutoff edge is 225 nm. Four emission transitions located 485, 542, 590 622 nm observed. green transition (5D4→7F5) 542 more intense than other transitions. defects in Tb:YAB were investigated transmission electron microscopy (TEM). Cracks inclusions main