Method of manufacturing semiconductor device, semiconductor device, and substrate processing apparatus

作者: Hideharu Itatani , Yuji Takebayashi , Sadayoshi Horii , Hirohisa Yamazaki , Arito Ogawa

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摘要: A high-k capacitor insulating film stable at a higher temperature is formed. There provided method of manufacturing semiconductor device. The comprises: forming an amorphous first comprising element on substrate; adding second different from the to so as form and annealing predetermined third by changing phase film. concentration added controlled according temperature.

参考文章(7)
Chris M. Carlson, Dave Peterson, Vishwanath Bhat, Cunyu Yang, Praveen Vaidyanathan, Noel Rocklein, Capacitors, dielectric structures, and methods of forming dielectric structures ,(2009)
Pan Kwi Park, Sang-Won Kang, Enhancement of dielectric constant in HfO2 thin films by the addition of Al2O3 Applied Physics Letters. ,vol. 89, pp. 192905- ,(2006) , 10.1063/1.2387126
P Sivasubramani, J Kim, MJ Kim, BE Gnade, RM Wallace, None, Effect of composition on the thermal stability of sputter deposited hafnium aluminate and nitrided hafnium aluminate dielectrics on Si (100) Journal of Applied Physics. ,vol. 101, pp. 114108- ,(2007) , 10.1063/1.2743818
Moon Sig Joo, Byung Jin Cho, Chia Ching Yeo, Daniel Siu Hung Chan, Sung Jin Whoang, S. Mathew, L.K. Bera, N. Balasubramanian, Dim-Lee Kwong, Formation of hafnium-aluminum-oxide gate dielectric using single cocktail liquid source in MOCVD process IEEE Transactions on Electron Devices. ,vol. 50, pp. 2088- 2094 ,(2003) , 10.1109/TED.2003.816920