Single-sided multilevel structure for silicon pressure transducers by masked-maskless etching technology

作者: Heng Yang , Jianjun Ren , Minhang Bao , Shaoqun Shen

DOI: 10.1117/12.284479

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摘要: A novel singled-sided multilevel island-beam-diaphragm structure has been designed and fabricated for an extremely high sensitivity pressure transducers by using a anisotropic etching technology called masked-maskless technology. The consists of two small islands overrange protection, shallow masses stress concentration, three thin beams on deep-etched diaphragm piezoresistors location. prototype transducer 400 pa operation range 0.6% nonlinearity tested.

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