Atomic-Scale Images of the Growth Surface of Ca1-xSrxCuO2 Thin Films
作者： K. Koguchi , T. Matsumoto , T. Kawai
DOI: 10.1126/SCIENCE.267.5194.71
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摘要: The surface microstructure of c-axis (Ca,Sr)CuO2 thin films, grown by laser molecular beam epitaxy on SrTiO3(001) substrates, was studied ultrahigh-vacuum scanning tunneling microscopy (STM). Images were obtained for codeposited Ca1–xSrxCuO2 which show a layered-type growth mode. surfaces consist atomically flat terraces separated steps that are one unit cell high. A pronounced dependence the mechanism Sr/Ca ratio films observed. Atomic resolution STM images CuO2 sheets in ab plane square lattice with an in-plane spacing 4 angstroms; contains different concentrations point defects, depending polarity sample-tip bias.
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