Repair capacity testing device and method

作者: Liu Zhending , Yan Xiaobao , Liu Yao , An Yabin , Liu Xiaowei

DOI:

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摘要: The invention discloses a repair capacity testing device and method, relates to the technical field of display, aims improve success rate film layer included in flexible backboard so as reduce difficulty backboard. comprises an electrical property tester simulation substrate, wherein substrate includes first simulated second which are stacked together, has defects. method applies proposed by above scheme. provided applied repairing layers.

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