Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics

摘要: We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically-assembled electronic nanotechnology. Several fault detection configurations are presented to target stuck-at faults, shorts, opens, and connection faults in nanoblocks switchblocks. also present an adaptive recovery through which we can identify defect-free switchblocks the nanofabric-under-test. The proposed BIST, recovery, defect tolerance procedures based on reconfiguration of nanofabric achieve complete coverage different types faults. show that large fraction blocks be recovered small number BIST configurations. simple bounds achieved given density. Simulation results various sizes, densities, random clustered defects. is well suited regular dense architectures have high densities