作者: D. Benzeggouta , I. Vickridge
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摘要: This handook is intended as a resource for scientists who use Ion Beam Analysis (IBA), to help them understand and minimise beam damage induced during the analysis. The basic physics of ion-matter interactions, from perspectve by Analysis, presented at level suitable post-graduate students. specificities in widely used IBA techniques such Backscattering Spectrometry (RBS), Nuclear Reaction (NRA), Elastic Recoil Detection (ERDA) Particle-Induced X-ray Emission (PIXE) are presented, followed sections on analysis different classes materials metals, semiconductors or polymers. A comprehensive bibliography included.