作者: R Langlis , R Baboian , L McBride , G Haynes
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摘要: Impact on corrosion testing technology of improved and miniaturized circuitry developed by the electronics component industry is described. Parts lists, identifications, circuit diagrams are given which can be used to construct inexpensive devices for tests. Devices made include potentiostats, power sources, zero resistance ammeters, buffer amplifiers. Special attention paid monitoring applications impressed current integrated units cathodic protection suitable use in places where space limited.