Low-Loss EELS in the STEM

作者: Nigel D. Browning , Ilke Arslan , Rolf Erni , Bryan W. Reed

DOI: 10.1007/978-1-4419-7200-2_16

关键词:

摘要: The main goal of this chapter is to introduce the concept “low-loss” or “valence loss” electron energy loss spectroscopy (VEELS) in STEM. Much discussion will assume that microscope aligned form optimum probe size (as described other chapters book) with only special attention being drawn monochromator and how its use modifies optics (i.e., formed). VEELS traditionally by processes are seen 0–50 eV region spectrum (Figure 16–1) typically characterized as collective excitations. These oscillations can provide key insights into optical electronic properties fundamentally different from composition structure information extracted core-loss spectra. Here we a basic physical model for these excitations allows materials be interpreted experimental spectra acquired

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