Semiconductor chip package and method and system for testing the same
作者： Sang-Ho Lee , Ki-Rock Kwon
DOI:
关键词:
摘要: A semiconductor chip package with a flash memory portion and method system for testing the same are provided. After an internal cycling test is automatically independently initiated on chip, other portions in performed. The includes first portion, at least one second portions, tester repetitively performing batch programming operation erase portion.
lens.org 参考文章(2)
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