Fungal Damage Detection in Wheat Using Short-Wave Near-Infrared Hyperspectral and Digital Colour Imaging

作者: C.B. Singh , D.S. Jayas , J. Paliwal , N.D.G. White

DOI: 10.1080/10942911003687223

关键词:

摘要: … This issue can be dealt by combining colour image features with NIR image features in … error, which can be eliminated by combining the NIR image features with colour image features. …

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