Investigating atomic details of the CaF2(111) surface with a qPlus sensor
作者： Franz J Giessibl , Michael Reichling
DOI: 10.1088/0957-4484/16/3/022
关键词:
摘要: The (111) surface of CaF2 has been intensively studied with large-amplitude frequency-modulation atomic force microscopy, and the contrast formation is now well understood. It shown that apparent patterns obtained a polar tip strongly depend on terminating ion, three sub-lattices anions cations can be imaged. Here, we study details CaF2(111) small-amplitude microscopy utilizing qPlus sensor to provide utmost resolution at high scanning stability. Step edges resulting from cleaving crystals in situ ultra-high vacuum appear as very sharp structures, flat terraces corrugation seen clarity even for large area scans. structure also not lost when across triple layer step edges. High-resolution scans small areas yield features anion- and cation unprecedented resolution. These are related previously reported theoretical results.
core.ac.uk
harvard.edu
sci-hub.se 参考文章(28)
Michael Reichling, Clemens Barth, Atomic Resolution Imaging on Fluorides Springer, Berlin, Heidelberg. pp. 109- 123 ,(2002) , 10.1007/978-3-642-56019-4_6
Adam Foster, Alexander Shluger, Clemens Barth, Michael Reichling, Contrast Mechanisms on Insulating Surfaces Springer, Berlin, Heidelberg. pp. 305- 347 ,(2002) , 10.1007/978-3-642-56019-4_17
Wolf Allers, Alexander Schwarz, Udo D. Schwarz, Low-Temperature Measurements: Principles, Instrumentation, and Application Springer, Berlin, Heidelberg. pp. 233- 256 ,(2002) , 10.1007/978-3-642-56019-4_14
Jascha Repp, Gerhard Meyer, Fredrik E Olsson, Mats Persson, Controlling the Charge State of Individual Gold Adatoms Science. ,vol. 305, pp. 493- 495 ,(2004) , 10.1126/SCIENCE.1099557
M. Reichling, C. Barth, Scanning Force Imaging of Atomic Size Defects on the CaF 2 \(111\) Surface Physical Review Letters. ,vol. 83, pp. 768- 771 ,(1999) , 10.1103/PHYSREVLETT.83.768
M. Guggisberg, M. Bammerlin, A. Baratoff, R. Lüthi, Ch. Loppacher, F.M. Battiston, J. Lü, R. Bennewitz, E. Meyer, H.-J. Güntherodt, Dynamic force microscopy across steps on the Si(111)-(7×7) surface Surface Science. ,vol. 461, pp. 255- 265 ,(2000) , 10.1016/S0039-6028(00)00592-6
P. W. Tasker, The stability of ionic crystal surfaces Journal of Physics C: Solid State Physics. ,vol. 12, pp. 4977- 4984 ,(1979) , 10.1088/0022-3719/12/22/036
F.J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart, Imaging silicon by atomic force microscopy with crystallographically oriented tips Applied Physics A. ,vol. 72, pp. 15- 17 ,(2001) , 10.1007/S003390100627
Rubén Pérez, Ivan Štich, Michael C. Payne, Kiyoyuki Terakura, Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111) Physical Review B. ,vol. 58, pp. 10835- 10849 ,(1998) , 10.1103/PHYSREVB.58.10835
Adam S. Foster, Clemens Barth, Alexander L. Shluger, Risto M. Nieminen, Michael Reichling, Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF2(111) as a reference surface Physical Review B. ,vol. 66, pp. 235417- ,(2002) , 10.1103/PHYSREVB.66.235417