作者: Adam Foster , Alexander Shluger , Clemens Barth , Michael Reichling
DOI: 10.1007/978-3-642-56019-4_17
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摘要: Sophisticated theoretical modelling has proved to be an essential ingredient in any progress towards understanding of the mechanisms AFM imaging on insulators (see, for example, [1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17]). In this chapter we will review recent non-contact insulators, conjunction with its applications ionic surfaces atomic resolution. principle, it is goal theory develop a reliable model, which can used interpret experimental images without resorting complex modelling. For NC-AFM, no such simple model yet exists and image interpretation often based direct simulation. As complexity techniques continues increase, groups have started work together that both sides problem need studied order arrive at sustainable models. Therefore, aim provide basic principles operation origins contrast, particular images.