Electronic test fixture

摘要: A continuity testing fixture for simultaneously probing of microelectronic chip site pads having a cluster probe pins extending from top plate in the same precise orientation as pads. The are individually urged into compliance by resilient pad disposed beneath forcing sharp end contiguous engagement allowing an external signal to determine workpiece. Individual insulated wires attached each on one and encompassed within cavity body terminating at connector near edge linking remote test source. In another embodiment, hollow contain wire independent be introduced way through indicating both workpiece independently.