作者: S.K. Nath , R. Dhawan , S. Rai , G.S. Lodha , K.J.S. Sokhey
DOI: 10.1016/J.PHYSC.2011.09.016
关键词:
摘要: Abstract We present the results of a study structural and superconducting properties polycrystalline Nb thin films (200 A, 300 A, 400 A, 700 A 1000 A) Nb/Cu bilayers (300 A/300 A 400 A/300 A) prepared on Si substrates by ion beam sputtering at room temperature. The thicknesses, roughnesses surfaces interfaces were determined X-ray reflectivity whereas grain sizes from grazing incidence diffraction transmission electron microscopic studies. transition temperature ( T C ) are smaller than bulk Nb. Nb-200 A sample does not show down to 2.3 K. average size grains varies 42 A for 69 A Nb-1000 A sample. Our that in these is only limited its thickness but also grains. deposited situ Cu layer (Nb/Cu) marginal increase as compare their respective values same thicknesses. As result observed. maximum decrease due oxygen intake during deposition should be about 0.5 K value (9.28 K). have attributed large our case basis Debye density states Fermi level compared