Scanning Force Microscopies Can Image Patterned Self-Assembled Monolayers
作者： James L. Wilbur , Hans A. Biebuyck , John C. MacDonald , George M. Whitesides
DOI: 10.1021/LA00003A025
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摘要: … //CP. Mixing of SAMs terminated by CH3, OH, or COOH could occur if the //CP process formed incomplete monolayers: … of the surface without a complete monolayer. In most cases, we …
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