作者: G. Hähner , A. Marti , N.D. Spencer
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摘要: We have investigated the lateral force (frictional) signalbetween Si3N4 tip of an AFM andSiO2 and AlOx surfaces in a 1 mMNaCl solution, as function pH. It was found that thefrictional depends strongly on both pH theisoelectric points (IEP) materials under investigation.A simple linear model describing dependence lateralforce total normal has been used to accountqualitatively for observed signal from single-asperity contact between surface nanometerscale. The pH-dependence signalon different oxide applied reverse thechemical contrast appropriate sample composed twodifferent oxides, thus demonstrating potential this method ``chemical imaging''.