Writing polarization bits on the multiferroic BiMnO3 thin film using Kelvin probe force microscope
作者： J. Y. Son , Bog G. Kim , C. H. Kim , J. H. Cho
DOI: 10.1063/1.1762974
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摘要: We report the multiferroic properties of epitaxially (100) oriented BiMnO3 thin film on LaAlO3 substrate and preferentially (111) Pt/TiO2/SiO2/Si substrate. Nano-size bits ferroelectric polarization can be easily written read by Kelvin force microscope (KFM). found that, for film, only has been induced at low writing biases, which makes reading process simple. This suggests that is a potential candidate high-density data storage device based KFM.
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