Chapter 5 Application to surface structure analyses

作者: Toshiaki Ohta , Kiyotaka Asakura , Toshihiko Yokoyama

DOI: 10.1016/S0926-4345(96)80006-X

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摘要: Publisher Summary This chapter discusses the most prominent advances in surface structure analysis using synchrotron radiation, especially addressing their potential as well some selected examples of research and also covers adsorbate-substrate systems. A simple application Surface Extended X-ray Absorption Fine Structure (SEXAFS), determination adsorption sites atomic adsorbates, subsequently present further SEXAFS studies on reconstruction, molecular adsorbate systems, use temperature dependence to investigate dynamic properties is presented. To determine structure, a surface-projected Patterson performed, which gives relative position each atom surface. analyze it necessary construct an UHV environment for preparing maintaining clean well-defined surfaces. Synchrotron radiation powerful technique science, with its high intensity, linear polarization, energy tunability. One can get considerable information about structures, such orientation molecule, sites, relaxation.

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