X-ray standing wave analysis with synchrotron radiation applied for surface and bulk systems
作者： G. Materlik , J. Zegenhagen
DOI: 10.1016/0375-9601(84)90587-5
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摘要: Abstract The advantageous use of synchrotron radiation for X-ray standing wave measurements is demonstrated. For bulk-like systems As implanted in Si was analysed with two reflection orders (220) and (440) which shows that lattice relaxation around the atom can be measured. case Br chemisorbed on Si(111) illustrated accomplished decrease measuring time increase precision.
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