Imaging modes with an annular detector in STEM
作者： J.M. Cowley , M.S. Hansen , S.-Y. Wang
DOI: 10.1016/0304-3991(94)00174-L
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摘要: Abstract An alternative to the use of electron holography as a means for enhancing bright-field image resolution in STEM is given by thin annular detector which intercepts outer edge central beam spot and gives an 1.7 times better than that normal imaging with axial detector. This has been confirmed experimentally case small limiting objective aperture. High-resolution images have also obtained “marginal imaging” mode just inside aperture so contrast approximates square differential projected potential distribution.
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