Micro-analysis by a Flying-Spot X-Ray Method

摘要: THE point-by-point investigation of a surface by analysis the characteristic X-ray line emission has been initiated Castaing1. He obtained an electron spot order 1 micron in diameter with electrostatic lens system and moved specimen under fixed spot; point examined was identified means optical viewing system. Analysis is greatly facilitated if scanned across counter used for collecting part emitted X-rays. The signal from it can be transferred to cathode-ray tube synchronism, so that picture displayed investigation. Such similar scanning microscope2. It differs appreciably proposed Pattee3, which scans thin target pure metal next placed examined, image contrast due not but differential absorption, as normal form projection microscope4.