Multivariate Calibration of ToF‐SIMS and XPS Data from Plasma‐Treated Polypropylene Thin Films
作者： Firas Awaja
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摘要: The multivariate analysis techniques of principal components (PCA), component regression (PCR), and partial least squares (PLSR) were used to calibrate time-of-flight secondaryion massspectrometry (ToF-SIMS)dataagainstX-rayphotoelectronspectroscopy (XPS) data obtained from plasma-treated polypropylene. This establishes correlations between quantitative information XPS with the molecular indicated by ToF-SIMS, allowing relative concentration CO functional groups C:O atomic ratio on surfaces polypropylene be predicted ToF-SIMS alone. A fourfactor prediction model was constructed, deemed as adequate predict concentrations surface groups, root mean square error (RMSEP) values 0.445 0.671at%,
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