Poly-dimethyl-siloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results
作者： Umut Oran , Ercan Ünveren , Thomas Wirth , WES Unger , None
DOI: 10.1016/J.APSUSC.2003.12.008
关键词:
摘要: … PDMS contamination on polystyrene samples was tested and the results were compared to the respective XPS … on the surface morphology of PS-PDMS diblock copolymer systems [18], …
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