作者: Pascal Martin , Bruce Collings
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摘要: Apparatus and methods for controlling contamination of components contained within the high- vacuum chambers mass spectrometer systems are provided. The apparatus employ a beam neutral gas injected in contra-flow configuration to incoming particle stream from ionization chamber. can be directly opposite counter-flow direction (e.g., 180 degrees) or at cross-flow angle ion flowing an between about 10 degrees 170 degrees). disrupts axial flow diverts molecules other undesirable contaminants before they reach high stages beyond IQ0 orifice) spectrometer. By reducing transmission into sensitive housed deep spectrometer, present invention increase throughput, improve robustness, and/or decrease downtime typically required vent/disassemble/clean fouled components.