Lattice Distortion Analysis Directly from High Resolution Transmission Electron Microscopy Images—the LADIA Program Package

摘要: Direct strain mapping from high resolution transmission electron microscopy images is possible for coherent structures.At proper imaging conditions the intensity peaks in image have a constant spatial relationship with projected atom columns.This allows determination of geometry unit cell without comparison simulations.The fast procedure particularly suited analysis large areas.The software package LADIA written PV-WAVE code and provides all necessary tools processing analysis.Image iintensity are determined by cross-correlation technique,which avoids problems noise low frequency renage.The lower limit that can be detected at sampling rate 44 pixels/nm ≈2%.