Control of plasma process by use of harmonic frequency components of voltage and current

作者: Mattan Kamon , Paul A. Miller

DOI:

关键词:

摘要: The present invention provides for a technique taking advantage of the intrinsic electrical non-linearity processing plasmas to add additional control variables that affect process performance. adjustment coupling circuitry, as well excitation level, in response measurements reactor voltage and current use capability modify plasma characteristics obtain desired

参考文章(24)
Kenji Yanagihara, Masahiro Niinomi, Method for controlling plasma chemical reactions ,(1979)
Craig A. Roderick, Kenneth S. Collins, Chan-Lon Yang, David N. K. Wang, Dan Maydan, VHF/UHF reactor system ,(1992)
Lee Chen, Gangadhara Swami Mathad, Monitoring technique for plasma etching ,(1986)
John Howard Keller, Joythi Singh, Gary Stewart Selwyn, Plasma amplified photoelectron process endpoint detection apparatus ,(1988)
Rudolf August Heinecke, Ian Paul Llewellyn, Sureshchandra Mishrilal Ojha, Pulsed plasma apparatus and process ,(1986)