作者: R. Gutmann , J. Hulliger , E. Reusser
DOI: 10.1016/0022-0248(93)90807-9
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摘要: Abstract Monocrystalline epitaxial layers of para- and ferroelectric KTa 1−x Nb x O 3 (KTN) were grown from KFKTN solution on (100) cubic KTaO by liquid phase epitaxy (LPE). Non-lattice-matched showed misfit relaxation defects at the substrate-layer interface produced lattice relaxation. Misfit induced could be avoided LPE K 1−y Na y Ta (KNTN). X-ray analysis pure doped KTN confirmed a reduction factor 4. The chemical composition main elements, F contents determined wavelength dispersive electron probe microanalysis (EPMA).