Auger electron and x‐ray photoelectron spectroscopy of monocrystalline layers of KTa1−xNbxO3grown by liquid‐phase epitaxy
作者： R. Gutmann , J. Hulliger , R. Hauert , E. M. Moser
DOI: 10.1063/1.349378
关键词:
摘要: Auger electron spectroscopy (AES), x‐ray photoelectron (XPS), and microprobe analysis (EMA) were applied to investigate the chemical composition, impurities, homogeneity of thin para‐ ferroelectric epitaxial KTa1−xNbxO3 (KTN) layers grown by liquid‐phase epitaxy using a KTN‐KF flux. AES indicated no Ta/Nb fluctuations within layer plane in growth direction. XPS EMA determined F incorporation 0.8–0.9 mol % for as‐grown 0.6 annealed samples. Valence analyses with paramagnetic resonance (EPR) revealed only regular valence state B atoms (I,V)ABO3 perovskite lattice. An unexpected splitting K 2p doublet peak was found layers. Structural defects observed optical microscopy topography attributed lattice relaxation effects. Optical waveguiding could be achieved
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