作者: J. Hulliger , R. Gutmann , P. Wa¨gli
DOI: 10.1016/0040-6090(89)90828-6
关键词:
摘要: Abstract Thin monocrystalline films of KTa1−xNbxO3 have been grown on [100] and [110] KTaO3 substrates by liquid-phase epitaxy (LPE) from diluted KF-KCl fluxes. Average growth rates 0.5–4 μm min−1 produced uniform film thicknesses ∼ 3 to 30 μm. As-grown were optically transparent showed a flat surface, whereas in orientation pronounced facets formed. The characterized means X-ray diffraction, microprobe analysis, scanning electron microscopy other methods.