作者: Slava Krylov , Ronen Maimon
DOI: 10.1115/1.1760559
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摘要: A detailed study of the transient nonlinear dynamics an electrically actuated micron scale beam is presented. model developed using Galerkin procedure with normal modes as a basis accounts for distributed electrostatic forces, squeezed film damping, and rotational inertia mass carried by beam. Special attention paid to near instability points. Results generated confirmed experimentally show that damping leads shrinkage spatial region where stable motion realizable. The voltage causes dynamic instability, in turn, approaches static pull-in value.