作者: Marc Petri , Dieter M Kolb , Ulrich Memmert , Heinrich Meyer
DOI: 10.1016/J.ELECTACTA.2003.07.011
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摘要: Copper deposition in the presence of an organic additive (3-mercaptopropionic acid, MPA) was studied by cyclic voltammetry and situ scanning tunneling microscopy (STM) results are compared to those for additive-free solutions. It is shown that underpotential (upd) copper onto a fully MPA-covered electrode produces defect-rich substrate, but defects blocked dense film bulk deposition, resulting low number nuclei. A grain-refining effect MPA, however, found, when Cu initiated shortly after addition MPA solution, i.e., low-coverage adlayer.