Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths

作者: Ilia Polian , Tobias Schubert , Sven Reimer , Bernd Becker , Matthias Sauer

DOI: 10.5555/2485288.2485395

关键词:

摘要: … In the dynamic compaction phase we utilize modern SATsolver techniques to generate test patterns that maximize the number of target paths sensitized at the same time. First, we …

参考文章(26)
Sandeep Gupta, Niraj K. Jha, Testing of Digital Systems ,(2003)
Kavita Ravi, Fabio Somenzi, Minimal Assignments for Bounded Model Checking tools and algorithms for construction and analysis of systems. pp. 31- 45 ,(2004) , 10.1007/978-3-540-24730-2_3
Irith Pomeranz, Sudhakar M. Reddy, On static compaction of test sequences for synchronous sequential circuits design automation conference. pp. 215- 220 ,(1996) , 10.1145/240518.240558
Paulo F Flores, Horácio C Neto, Joao P Marques-Silva, None, An exact solution to the minimum size test pattern problem ACM Transactions on Design Automation of Electronic Systems. ,vol. 6, pp. 629- 644 ,(2001) , 10.1145/502175.502186
Alexander Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker, Dynamic Compaction in SAT-Based ATPG asian test symposium. pp. 187- 190 ,(2009) , 10.1109/ATS.2009.31
Matthias Sauer, Jie Jiang, Alexander Czutro, Ilia Polian, Bernd Becker, Efficient SAT-Based Search for Longest Sensitisable Paths asian test symposium. pp. 108- 113 ,(2011) , 10.1109/ATS.2011.43
Donald Loveland, George Logemann, Martin Davis, A machine program for theorem-proving ,(2011)
M. Sauer, S. Reimer, I. Polian, T. Schubert, B. Becker, Provably optimal test cube generation using quantified boolean formula solving asia and south pacific design automation conference. pp. 533- 539 ,(2013) , 10.1109/ASPDAC.2013.6509651
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato, A dynamic test compaction procedure for high-quality path delay testing Proceedings of the 2006 conference on Asia South Pacific design automation - ASP-DAC '06. pp. 348- 353 ,(2006) , 10.1145/1118299.1118388
Stephan Eggersglu, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler, A new SAT-based ATPG for generating highly compacted test sets design and diagnostics of electronic circuits and systems. pp. 230- 235 ,(2012) , 10.1109/DDECS.2012.6219063