作者: S. Delpino , D. Fabiani , G.C. Montanari , R. Bodega , P.H.F. Morshuis
DOI: 10.1109/ICSD.2007.4290860
关键词:
摘要: This paper analyzes the behaviour of dielectric interfaces on space charge trapping features electrical insulation systems. In particular, results measurements performed at different temperatures chemical and physical dual-dielectric minicables are here presented discussed. Interfacial polarization due to conductivity/permittivity mismatch between insulations is investigated together with accumulation interface injection from electrodes. The presence interfaces, particularly seems give rise a significant build-up, which, in turn, able distort actual electric field, overstressing respect design field.