Tunnelling scanning microscope

摘要: A tunnelling scanning microscope comprising a probe (8) having fine conductive tip; means (6,7) for positioning the tip of said sufficiently close to surface sample (5) be investigated so that current flows; (13) across with (8); (14) automatically controlling distance between and during in response measured tunnel current; display producing an image configuration characterised light source (9) is provided irradiating surface.