Scanning probe type microscope apparatus
作者： Hiroyuki Matsushiro , Hideaki Ohkubo , Tetsuji Onuki , Toru Fujii , Masatoshi Suzuki
DOI:
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摘要: A high resolution scanning probe type microscope capable for simultaneous observation of the optical images a sample and tip. The has construction in which are supported with separate supporting members is disposed inside visual field microscope. installed on vibration-proof table, member double-end-supported beam construction.
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