Atomic force microscope
作者： Hiroshi Kajimura , Hirofumi Miyamoto , Hiroko Ohta , Tsugiko Takase , Shuzo Mishima
DOI:
关键词:
摘要: An atomic force microscope comprises a probe having sharply-pointed tip end. The is supported on the free end portion of cantilever and close to surface specimen. When an interatomic produced, deformed, displaced. displacement detected by optical system. A light beam emitted from source collimated lens, reflected polarized beam-splitter, also half-mirror. Then, passes through quarter wavelength plate objective such that converged cantilever. returns along same path splitter. divided into two beams at These are respective prisms then incident photodetectors. photodetectors detect probe.
google.com.mx参考文章(19)
Hiroshi Kajimura, Tsugiko Takase, Hisanari Shimazu, Hideo Adachi, Hideo Tomabechi, Takao Okada, Sensor having a cantilever ,(1990)
Johann Greschner, Wolfgang D. Pohl, Urs T. Duerig, James K. Gimzewski, Olaf Wolter, Micromechanical atomic force sensor head ,(1987)
Hirofumi Miyamoto, Hiroko Ohta, Tsugiko Takase, Shuzo Mishima, Takao Okada, Probe unit for an atomic probe microscope ,(1990)
Shinya Akamine, Thomas R. Albrecht, Thomas E. Carver, Microminiature cantilever stylus ,(1989)
H. Heinzelmann, E. Meyer, P. Grütter, H.‐R. Hidber, L. Rosenthaler, H.‐J. Güntherodt, Atomic force microscopy : general aspects and application to insulators Journal of Vacuum Science and Technology. ,vol. 6, pp. 275- 278 ,(1988) , 10.1116/1.575424
T. R. Albrecht, C. F. Quate, Atomic resolution imaging of a nonconductor by atomic force microscopy Journal of Applied Physics. ,vol. 62, pp. 2599- 2602 ,(1987) , 10.1063/1.339435
C. Schönenberger, S. F. Alvarado, A differential interferometer for force microscopy Review of Scientific Instruments. ,vol. 60, pp. 3131- 3134 ,(1989) , 10.1063/1.1140543
Y. Martin, C. C. Williams, H. K. Wickramasinghe, Atomic force microscope–force mapping and profiling on a sub 100‐Å scale Journal of Applied Physics. ,vol. 61, pp. 4723- 4729 ,(1987) , 10.1063/1.338807
Gerd K. Bennig, Atomic force microscope and method for imaging surfaces with atomic resolution ,(1986)
A. J. den Boef, Scanning force microscopy using a simple low‐noise interferometer Applied Physics Letters. ,vol. 55, pp. 439- 441 ,(1989) , 10.1063/1.101891