Orientation sensitivity of focused ion beam damage in pure zirconium: direct experimental observations and molecular dynamics simulations

摘要: A high-purity predominantly single crystalline zirconium was subjected to controlled focused ion beam (FIB) damage. Damage estimates were obtained from electron backscattered diffraction (EBSD) and nano-indentation measurements on exactly the same area/orientation. The damage kinetics, between different crystallographic orientations, differed by one order of magnitude a clear hierarchy orientation sensitive emerged. Use simple geometric approach, linear density atoms corresponding scattering cross-sections impinging gallium ions, could differentiate extreme kinetics; but failed when such differences relatively minor. Numerically intensive molecular dynamics (MD) simulations, other hand, more effective. However, MD simulations or direct EBSD observations justify anisotropic irradiation hardening (AIH): 3–8 times for near basal. Though explanation AIH is indirect, evidence rationalization orientation-sensit...