In Situ TEM Microcompression of Single and Bicrystalline Samples: Insights and Limitations

摘要: In situ micromechanical compression experiments in a transmission electron microscope enable the study and analysis of small-scale deformation behavior. The implementation instrumented indenter systems allows measuring force displacement, providing additionally insights on sample strength flow Using focused ion beam preparation, single- bicrystalline specimens can be fabricated to influence individual grain boundaries mechanical Taperless single crystalline Cu pillars including coherent twin boundary were deformed scanning conventional microscopy mode applicability both techniques for examining dislocation dynamics interaction with boundary. Based experimental results, possibilities limitations such are critically discussed, annealing remove beam-induced defects, imaging dislocations, acquisition stress–strain data. Finally, an outlook is given potential microscopic analyzing