作者: K. Barmak
DOI: 10.1533/9780857096296.1.39
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摘要: Abstract: This chapter briefly describes electron backscatter diffraction (EBSD) for crystal orientation mapping in the scanning microscope (SEM) and precession (PED) transmission (TEM). The procedure extraction of relative grain boundary energy plane distribution tilt boundaries from EBSD maps a micrometric fiber-textured Al film is detailed. Grain character nanometric Cu films extracted two-dimensional PED-TEM using stereological analysis. importance frame reference studies discussed.