Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

摘要: Over the past decade, efforts have been made to develop nondestructive techniques for three-dimensional (3D) grain-orientation mapping in crystalline materials. 3D x-ray diffraction microscopy and differential-aperture can now be used generate orientation maps with a spatial resolution of 200 nanometers (nm). We describe here technique that enables transmission electron microscope mono- multiphase nanocrystalline materials reaching 1 nm. demonstrate by an experimental study aluminum sample use simulations validate principles involved.